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RN2007~RN2009
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)
RN2007,RN2008,RN2009
Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications
l With built-in bias resistors l Simplify circuit design l Reduce a quantity of parts and manufacturing process l Complementary to RN1007~RN1009 Unit: mm
Equivalent Circuit and Bias Resister Values
Type No. RN2007 RN2008 RN2009
R1 (k) 10 22 47
R2 (k) 47 47 22
Maximum Ratings (Ta = 25C)
Characteristic Collector-base voltage Collector-emitter voltage RN2007 Emitter-base voltage RN2008 RN2009 Collector current Collector power dissipation Junction temperature Storage temperature range IC PC Tj Tstg VEBO Symbol VCBO VCEO Rating -50 -50 -6 -7 -15 -100 400 150 -55~150
JEDEC EIAJ TOSHIBA Weight: 0.21g
TO-92 SC-43 2-5F1B
Unit V V
V
mA mW C C
1
2001-06-07
RN2007~RN2009
Electrical Characteristics (Ta = 25C)
Characteristic Collector cut-off current RN2007 Emitter cut-off current RN2008 RN2009 RN2007 DC current gain RN2008 RN2009 Collector-emitter saturation voltage RN2007 Input voltage (ON) RN2008 RN2009 RN2007 Input voltage (OFF) RN2008 RN2009 Transition frequency Collector Output capacitance RN2007 Input resistor RN2008 RN2009 RN2007 Resistor ratio RN2008 RN2009 R1/R2 R1 fT Cob VCE = -10V, IC = -5mA VCB = -10V, IE = 0, f = 1MHz VI (OFF) VCE = -5V, IC = -0.1mA VI (ON) VCE = -0.2V, IC = -5mA VCE (sat) IC = -5mA, IB = -0.25mA hFE VCE = -5V, IC = -10mA IEBO Symbol ICBO ICEO Test Circuit Test Condition VCB = -50V, IE = 0 VCE = -50V, IB = 0 VEB = -6V, IC = 0 VEB = -7V, IC = 0 VEB = -15V, IC = 0 Min -0.081 -0.078 -0.167 80 80 70 -0.7 -1.0 -2.2 -0.5 -0.6 -1.5 7 15.4 32.9 0.191 0.421 1.92 Typ. -0.1 200 3 10 22 47 0.213 0.468 2.14 Max -100 -500 -0.15 -0.145 -0.311 -0.3 -1.8 -2.6 -5.8 -1.0 -1.16 -2.6 6 13 28.6 61.1 0.232 0.515 2.35 k MHz pF V V V mA Unit nA
2
2001-06-07
RN2007~RN2009
3
2001-06-07
RN2007~RN2009
4
2001-06-07
RN2007~RN2009
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice.
5
2001-06-07

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